High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM
This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.
This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.
- Company：MSHシステムズ
- Price：Other
